2004

(1)I. Takahashi, K. Inoue, A. Kitahara, H. Terauchi, and O. Sakata, Metal/Semiconductor interfaces studied by transmitted X-ray reflectivity, Japanese Journal of Applied Physics, (2004) Vol.43, 1561-1565.

(2)A.Kitahara,S.Doi,and I.Thakahashi:Melting Behavior of Polystyrene Surface Studied by X-ray Reflectivity, Slow Dynamics in Complex Systems:3rd International Symposium (2004) 255-256

(3)Hiroyuki Kikkawa,Amane Kitahara and Isao Takahashi:Observation on Surface Change of Fragile Glass:Temperature-Time Dependence Studied by X-Ray Reflectivity, Slow Dynamics in Complex Systems:3rd International Symposium (2004) 619-622