1998

(1)I. Takahashi, K. Ueda, Y. Tsukahara, A. Ichimiya and J. Harada: An X-ray reflectivity study of surface layering in a magnetic fluid, J. Phys.: Condens. Matter 10 (1998) 4489-4497.

(2)I. Takahashi, S. Okita, N. Awaji, Y. Sugita and S. Komiya: Microcrystallinity at SiO2-Si(001) interfaces: an effect of annealing, Physica B 245 (1998) 306-310.